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EFM8LB1 Datasheet, PDF (21/70 Pages) Silicon Laboratories – The EFM8LB1 device family are fully integrated, mixed-signal system-on-a-chip MCUs. Highlighted features are listed below
EFM8LB1 Data Sheet
Electrical Specifications
Parameter
Symbol Test Condition
Min
Typ
Max
Unit
Power Supply Rejection Ratio
PSRRADC
—
TBD
—
dB
DC Performance
Integral Nonlinearity
INL
14 Bit Mode
-3.54
-1.2 / +5
8.54
LSB
12 Bit Mode
-1.9 -0.35 / +1
1.9
LSB
10 Bit Mode
-0.6
±0.2
0.6
LSB
Differential Nonlinearity (Guaran- DNL
teed Monotonic)
14 Bit Mode
12 Bit Mode
-14
±1
2.54
LSB
-0.9
±0.3
0.9
LSB
10 Bit Mode
-0.5
±0.2
0.5
LSB
Offset Error
EOFF
14 Bit Mode
-84
-2.5
84
LSB
12 Bit Mode
-2
0
2
LSB
10 Bit Mode
-1
0
1
LSB
Offset Temperature Coefficient
TCOFF
—
TBD
—
LSB/°C
Slope Error
EM
14 Bit Mode
-154
—
154
LSB
12 Bit Mode
-2.5
—
2.5
LSB
10 Bit Mode
-1.1
—
1.1
LSB
Dynamic Performance 10 kHz Sine Wave Input 1 dB below full scale, Max throughput, using AGND pin
Signal-to-Noise
SNR
14 Bit Mode
664
72
—
dB
12 Bit Mode
64
68
—
dB
10 Bit Mode
59
61
—
dB
Signal-to-Noise Plus Distortion
SNDR
14 Bit Mode
664
72
—
dB
12 Bit Mode
64
68
—
dB
10 Bit Mode
59
61
—
dB
Total Harmonic Distortion (Up to
5th Harmonic)
THD
14 Bit Mode
12 Bit Mode
—
-74
—
dB
—
-72
—
dB
10 Bit Mode
—
-69
—
dB
Spurious-Free Dynamic Range
SFDR
14 Bit Mode
—
74
—
dB
12 Bit Mode
—
74
—
dB
10 Bit Mode
—
71
—
dB
Note:
1. This time is equivalent to four periods of a clock running at 18 MHz + 2%.
2. Conversion Time does not include Tracking Time. Total Conversion Time is:
Total Conversion Time = RPT × (ADTK + NUMBITS + 1) × T(SARCLK) + (T(ADCCLK) × 4)
where RPT is the number of conversions represented by the ADRPT field and ADCCLK is the clock selected for the ADC.
3. Absolute input pin voltage is limited by the VIO supply.
4. Measured with characterization data and not production tested.
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