EZR32LG330 Datasheet, PDF (12/87 Pages) Silicon Laboratories – Building and home automation

4. Electrical Specifications
EZR32LG330 Data Sheet
Electrical Specifications
4.1 Test Conditions
4.1.1 Typical Values
The typical data are based on T_AMB = 25°C and V_DD = 3.0 V, as defined in Table 4.3 General Operating Conditions on page 12, by
simulation and/or technology characterisation unless otherwise specified.
4.1.2 Minimum and Maximum Values
The minimum and maximum values represent the worst conditions of ambient temperature, supply voltage and frequencies, as defined
in Table 4.3 General Operating Conditions on page 12, by simulation and/or technology characterisation unless otherwise specified.
4.2 Absolute Maximum Ratings
The absolute maximum ratings are stress ratings, and functional operation under such conditions are not guaranteed. Stress beyond
the limits specified in the table below may affect the device reliability or cause permanent damage to the device. Functional operating
conditions are given in Table 4.3 General Operating Conditions on page 12.
Table 4.1. Absolute Maximum Ratings
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Storage temperature
range
T_STG
-55
─
150¹
°C
Maximum soldering tem-
T_S
Latest IPC/
─
perature
JEDEC J-
STD-020 Stand-
ard
─
260
°C
External main supply
voltage
V_DDMAX
0
─
3.8
V
Voltage on any I/O pin
V_IOPIN
-0.3
─
V_DD+0.3
V
Note:
1. Based on programmed devices tested for 10000 hours at 150 ºC. Storage temperature affects retention of preprogrammed cali-
bration values stored in flash. Please refer to the Flash section in the Electrical Characteristics for information on flash data reten-
tion for different temperatures.
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