S-8243AACFT-TB-X Datasheet, PDF (8/35 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC

BATTERY PROTECTION IC FOR 3-SERIAL OR 4-SERIAL CELL PACK
S-8243A/B Series
Rev.3.1_00
Table 6 (2 / 2)
Item
Symbol
Remarks
INPUT CURRENT
Current consumption at not
monitoring V_BATOUT
I_OPE
Current consumption at power down I_PDN
Current for VCn at not monitoring
V_BATOUT (n = 2, 3)
I_VCnN
Current for VC2 at monitoring of
V_BATOUT
I_VC2
Current for VC3 at monitoring of
V_BATOUT
I_VC3
Current for CTL1 at Low
I_CTL1L
Current for CTLn at High
n = 2,3,4
I_CTLnH
V1 = V2 = V3 = 3.5 V, V_MP = V_DD
V1 = V2 = V3 = 1.5 V, V_MP = V_SS
V1 = V2 = V3 = 3.5 V
V1 = V2 = V3 = 3.5 V
V1 = V2 = V3 = 3.5 V
V1 = V2 = V3 = 3.5 V, V_CTL1 = 0 V
V_CTLn = V_OUT
Current for CTLn at Low
n = 2,3,4
I_CTLnL
V_CTLn = 0 V
OUTPUT CURRENT
Leak current COP
Sink current COP
Source current DOP
Sink current DOP
Source current V_BATOUT
Sink current V_BATOUT
I_COH
I_COL
I_DOH
I_DOL
I_VBATH
I_VBATL
V_COP = 24 V
V_COP = V_SS+0.5 V
V_DOP = V_DD−0.5 V
V_DOP = V_SS+0.5 V
V_BATOUT = V_DD−0.5 V
V_BATOUT = V_SS+0.5 V
Min.
Typ.
Max. Unit Test circuit
−
65
120
μA
1
−
−
0.1
μA
1
−0.3
0
0.3
μA
3
−
2.0
7.2
μA
3
−
1.0
4.0
μA
3
−0.4
−0.2
−
μA
5
−
2.5
5
μA
9
−5
−2.5
−
μA
9
−
−
0.1
μA
9
10
−
−
μA
9
10
−
−
μA
9
10
−
−
μA
9
100
−
−
μA
9
100
−
−
μA
9
Applied to S-8243AACFT and S-8243AADFT
Item
Symbol
Conditions
Min.
Typ.
Max. Unit Test circuit
DELAY TIME
Overcharge detection delay time t_CU
C_CT = 0.1 μF
0.5
1.0
1.5
s
5
Overdischarge detection delay time t_DL
C_DT = 0.1 μF
50
100
150
ms
5
Overcurrent detection delay time 1 t_lOV1 C_DT = 0.1 μF
5
10
15
ms
5
Overcurrent detection delay time 2 t_lOV2
−
1.5
2.5
4.0
ms
4
Overcurrent detection delay time 3 t_lOV3
−
100
300
600
μs
4
*1. Temperature coefficient for detection and release voltage is applied to overcharge detection voltage n, overcharge release voltage n, overdischarge
detection voltage n, and overdischarge release voltage n.
*2. Temperature coefficient for overcurrent detection voltage is applied to over current detection voltage 1 and 2.
*3. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed by design, not tested in
production.
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