S-8213AAB-I6T1U Datasheet, PDF (12/28 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 2-SERIAL

BATTERY PROTECTION IC FOR 2-SERIAL / 3-SERIAL CELL PACK (SECONDARY PROTECTION)
S-8213 Series
Rev.1.3_03
3. Test mode
The overcharge detection delay time (tCU) can be shortened by entering the test mode.
The test mode can be set by retaining the VDD pin voltage 4.0 V or more higher than the VC1 pin voltage for 20 ms or
longer. The status is retained by the internal latch and the test mode is retained even if the VDD pin voltage is
decreased to the same voltage as that of the VC1 pin voltage.
After that, the latch for retaining the test mode is reset and the S-8213 Series exits from test mode under the overcharge
status.
VDD pin voltage
VC1 pin voltage
Pin voltage
4.0 V or
more
V_CUn
Battery voltage
(n = 1 to 3)
V_HCn
Test mode
t_TST = 20 ms max.
CO pin
(Active "H")
CO pin
(Active "L")
32 ms typ.
Figure 11
2.0 ms typ.
12