S-8264AAA-I8T1U Datasheet, PDF (11/36 Pages) Seiko Instruments Inc – BATTERY PROTECTION IC FOR 2-SERIAL

Rev.4.2_02
BATTERY PROTECTION IC FOR 2-SERIAL TO 4-SERIAL-CELL PACK (SECONDARY PROTECTION)
S-8264A/B/C Series
2. Detection Delay Time
(1) S-8264AAA, S-8264AAB, S-8264AAC, S-8264AAE, S-8264AAH, S-8264BAA, S-8264BAB
Table 10
Item
Symbol
Condition
Min.
DELAY TIME
Overcharge detection delay
time
t_CU
⎯
3.2
Overcharge timer reset
delay time
t_TR
⎯
6
Overcharge release delay
time
t_CL
⎯
51
CTL pin response time
t_CTL
⎯
⎯
Transition time to Test
mode
t_TST
V1 = V2 = V3 = V4 = 3.5 V,
V_DD ≥ V_SENSE + 8.5 V
⎯
(Ta = 25°C unless otherwise specified)
Typ.
Max.
Unit
Test Test
Condition Circuit
4.0
4.8
s
2
1
12
20
ms
3
1
64
77
ms
2
1
⎯
2.5
ms
4
2
⎯
80
ms
5
3
(2) S-8264AAD, S-8264AAF, S-8264AAG, S-8264AAI, S-8264CAA, S-8264CAB
Table 11
Item
Symbol
Condition
Min.
DELAY TIME
Overcharge detection delay
time
t_CU
⎯
1.6
Overcharge timer reset
delay time
t_TR
⎯
6
Overcharge release delay
time
t_CL
⎯
1.6
CTL pin response time
t_CTL
⎯
⎯
Transition time to Test
mode
t_TST
V1 = V2 = V3 = V4 = 3.5 V,
V_DD ≥ V_SENSE + 8.5 V
⎯
(Ta = 25°C unless otherwise specified)
Typ.
Max.
Unit
Test Test
Condition Circuit
2.0
2.4
s
2
1
12
20
ms
3
1
2.0
3.0
ms
2
1
⎯
2.5
ms
4
2
⎯
80
ms
5
3
(3) S-8264AAJ, S-8264AAK, S-8264AAO, S-8264AAS, S-8264AAT
Table 12
Item
Symbol
Condition
Min.
DELAY TIME
Overcharge detection delay
time
t_CU
⎯
4.5
Overcharge timer reset
delay time
t_TR
⎯
8
Overcharge release delay
time
t_CL
⎯
70
CTL pin response time
t_CTL
⎯
⎯
Transition time to Test
mode
t_TST
V1 = V2 = V3 = V4 = 3.5 V,
V_DD ≥ V_SENSE + 8.5 V
⎯
(Ta = 25°C unless otherwise specified)
Typ.
Max.
Unit
Test Test
Condition Circuit
5.65
6.8
s
2
1
17
28
ms
3
1
88
110
ms
2
1
⎯
2.5
ms
4
2
⎯
80
ms
5
3
11