S-5725CNBL9-M3T1U Datasheet, PDF (10/31 Pages) Seiko Instruments Inc – HIGH-SPEED BIPOLAR HALL EFFECT LATCH

HIGH-SPEED BIPOLAR HALL EFFECT LATCH
S-5725 Series
Rev.2.5_01
1. 3 S-5725ExBxx
Table 11
Item
Power supply voltage
Current consumption
Output voltage
Leakage current
Awake mode time
Symbol
VDD
IDD
VOUT
ILEAK
tAW
(Ta = +25°C, VDD = 5.0 V, VSS = 0 V unless otherwise specified)
Condition
Min.
Typ.
Max.
Unit
Test
Circuit
−
2.7
5.0
5.5
V
−
Average value
− 1400.0 2000.0 μA 1
Nch open-drain output Output transistor Nch,
product
IOUT = 2 mA
−
−
0.4
V
2
Output transistor Nch,
CMOS output product
IOUT = 2 mA
Output transistor Pch,
IOUT = −2 mA
−
VDD −
0.4
−
−
0.4
V
−
V
2
3
Nch open-drain output product
Output transistor Nch, VOUT = 5.5 V
−
−
1
μA
4
−
−
50
−
μs
−
Sleep mode time
tSL
−
−
0
−
μs
−
Operating cycle
tCYCLE
tAW + tSL
−
50
100 μs
−
10