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HYM324020S-GS50 Datasheet, PDF (5/10 Pages) Siemens Semiconductor Group – 4M x 32-Bit Dynamic RAM Module
HYM 324020S/GS-50/-60
4M x 32-Bit
Absolute Maximum Ratings
Operation temperature range ......................................................................................... 0 to + 70 °C
Storage temperature range......................................................................................... – 55 to 125 °C
Input/output voltage ............................................................................–0.5V to min (Vcc+0.5, 7.0) V
Power supply voltage...................................................................................................... – 1 to + 7 V
Power dissipation................................................................................................................... 6.72 W
Data out current (short circuit) ................................................................................................ 50 mA
Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent
damage of the device. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
DC Characteristics
TA = 0 to 70 °C, VSS = 0 V, VCC = 5 V ± 10 %; tT = 5 ns
Parameter
Symbol
Limit Values
min.
max.
Input high voltage
VIH
Input low voltage
VIL
Output high voltage (IOUT = – 5 mA)
VOH
Output low voltage (IOUT = 4.2 mA)
VOL
Input leakage current
II(L)
(0 V ≤ VIH ≤ Vcc + 0.3V, all other pins = 0 V)
Output leakage current
IO(L)
(DO is disabled, 0 V ≤ VOUT ≤ Vcc + 0.3V)
Average VCC supply current:
ICC1
-50 ns version
-60 ns version
(RAS, CAS, address cycling: tRC = tRC min.)
Standby VCC supply current
ICC2
(RAS = CAS = VIH)
Average VCC supply current, during RAS-only ICC3
refresh cycles:
-50 ns version
-60 ns version
(RAS cycling, CAS = VI,H, tRC = tRC min.)
Average VCC supply current,
ICC4
during fast page mode: -50 ns version
-60 ns version
(RAS = VIL, CAS, address cycling:tPC = tPC min.)
2.4
– 0.5
2.4
–
– 20
– 10
Vcc+0.5
0.8
–
0.4
20
10
–
960
–
880
–
16
–
960
–
880
–
320
–
280
Unit Test
Condition
V
1)
V
1)
V
1)
V
1)
µA 1)
µA 1)
mA 2) 3) 4)
mA 2) 3) 4)
mA –
mA 2) 4)
mA 2) 4)
mA 2) 3) 4)
mA 2) 3) 4)
Semiconductor Group
5