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| LUYT801-S Datasheet, PDF (7/13 Pages) Seoul Semiconductor – Industry Standard PLCC SMT package | |||
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5 Reliability
Item
Reference
Thermal Shock
EIAJ ED-4701
Temperature Cycle EIAJ ED-4701
High Temperature
Storage
High Temperature
High Humidity
Storage
Low Temperature
Storage
Operating
Endurance Test
High Temperature
High Humidity Life
Test
High Temperature
Life Test
Low Temperature
Life Test
ESD(HBM)
EIAJ ED-4701
EIAJ ED-4701
EIAJ ED-4701
Internal
Reference
Internal
Reference
Internal
Reference
Internal
Reference
MIL-STD-
883D
Test Condition
Ta =-40â (20min) ~ 100oC (20min)
(Transfer time : < 20sec)
Ta =-40oC (30min) ~ 100oC (30min)
(Transfer time : 5min)
Ta =100oC
Ta =85oC, RH=85%
Ta =-40oC
Ta =25oC, IF =30mA
Ta =85oC, RH=85%, IF =20mA
Ta =100oC, IF =5mA
Ta =-40oC, IF =20mA
1KV at 1.5kâ¦; 100pF
Duration
/ Cycle
100 Cycle
Number
of
Damage
0/22
100 Cycle
1000
Hours
1000
Hours
1000
Hours
1000
Hours
0/22
0/22
0/22
0/22
0/22
500 Hours 0/22
1000
Hours
1000
Hours
3 Time
0/22
0/22
0/22
Criteria for Judging the Damage
Item
Forward Voltage
Reverse Current
Luminous Intensity
Symbol
VF
IR
IV
Condition
IF =20mA
VR=5V
IF =20mA
Criteria for Judgement
MIN
MAX
-
USL*1 Ã 1.2
-
USL*1 Ã 2.0
LSL*2 Ã 0.5
-
Note : *1 USL : Upper Standard Level
*2 LSL : Lower Standard Level
Rev. 00
September. 2010
www.seoulsemicon.com
ììë²í¸ : SSC-QP-7-07-24 (Rev.00)
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