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HAF2005_15 Datasheet, PDF (7/10 Pages) Renesas Technology Corp – Silicon N Channel MOS FET Series Power Switching
HAF2005
Static Drain to Source on State Resistance
vs. Temperature
0.10
Pulse Test
0.08
0.06
0.04
VGS = 4 V
5 A, 10 A
ID = 20 A
0.02
0
–40
ID = 20 A
5 A, 10 A
10 V
0
40 80 120 160
Case Temperature Tc (°C)
1000
500
Body-Drain Diode Reverse
Recovery Time
200
100
50
20
10
0.5 1 2
di / dt = 50 A / µs
VGS = 0, Ta = 25°C
5 10 20 50
Reverse Drain Current IDR (A)
Reverse Drain Current vs.
Source to Drain Voltage
50
Pulse Test
40
VGS = 5 V
30
0V
20
10
0
0 0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage VSD (V)
Forward Transfer Admittance vs.
Drain Current
100
VDS = 10 V
50
Pulse Test
Tc = –25°C
20
10
25°C
5
75°C
2
1
0.5 1 2
5 10 20 50
Drain Current ID (A)
1000
500
Switching Characteristics
VGS = 5 V, VDD = 30 V
PW = 300 µs, duty ≤ 1 %
200
100
tr
50
20
10
0.5
td(on)
12
tf
td(off)
5 10 20 50
Drain Current ID (A)
10000
Typical Capacitance vs.
Drain to Source Voltage
3000
1000
Coss
300
100
30 VGS = 0
f = 1 MHz
10
0
10
20
30
40
50
Drain to Source Voltage VDS (V)
Rev.4.00 Sep 07, 2005 page 5 of 7