PE97240 Datasheet, PDF (4/21 Pages) Peregrine Semiconductor – Radiation Tolerant UltraCMOS Integer-N Frequency Synthesizer for Low Phase Noise Applications

Table 2. Operating Ratings
Parameter/Condition Symbol Min
Max
Unit
Supply voltage
Operating ambient
temperature range
V_DD
2.6
2.8
V
T_A
–40
+85
C
Table 3. Absolute Maximum Ratings
Parameter/Condition Symbol Min
Max
Unit
Supply voltage
Voltage on any input
DC into any input
DC into any output
RF input power, CW
50 MHz–5 GHz
V_DD
–0.3
3.3
V
V_I
–0.3 V_DD + 0.3 V
I_I
–10
+10
mA
I_O
–10
+10
mA
P_{MAX_CW}
10
dBm
Thermal resistance
T_JC
Junction temperature
T_J
Storage temperature range T_ST
–65
ESD voltage HBM¹
All pins except pin 28
ESD voltage HBM^1,2
On pin 28
V_{ESD_HBM}
33.4
+125
+150
1000
°C/W
°C
°C
V
300
V
Notes: 1. Human Body Model (MIL-STD-883 Method 3015).
2. Pin 28 is not used in normal operation.
Exceeding absolute maximum ratings may cause
permanent damage. Operation should be
restricted to the limits in the Operating Ranges
table. Operation between operating range
maximum and absolute maximum for extended
periods may reduce reliability.
PE97240
Product Specification
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the rating specified.
Latch-Up Immunity
Unlike conventional CMOS devices, UltraCMOS
devices are immune to latch-up.
ELDRS
UltraCMOS devices do not include bipolar minority
carrier elements, and therefore do not exhibit
enhanced low dose rate sensitivity.
Table 4. Single Event Effects¹
SEE Mode
Effective Linear Energy Transfer (LET)²
SEL
SEFI
SEU
SET
86 MeVcm²/mg
86 MeVcm²/mg
86 MeVcm²/mg
30 MeVcm²/mg ³
Notes:
1. Testing performed using serial programming mode.
2. SEE testing was conducted with Au, Ho, Xe, Kr, Cu ion species at 0°
incidence.
3. Minor transients (phase errors) observed resulting in self-recovering
operation without intervention.
©2010-2015 Peregrine Semiconductor Corp. All rights reserved.
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Document No. DOC-15214-7 │ UltraCMOS^® RFIC Solutions