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74ABTL3205 Datasheet, PDF (8/14 Pages) NXP Semiconductors – 10-bit BTL transceiver with registers
Philips Semiconductors
10-bit BTL transceiver with registers
Product specification
74ABTL3205
LIVE INSERTION SPECIFICATIONS
SYMBOL
PARAMETER
VBIASV
IBIASV
ǸBn
Bias pin DC current
Bias pin DC current
Bus voltage during prebias
VCC = 0 to 5.25V, Bn = 0 to 2.0 V
VCC = 0 to 4.75 V, Bn = 0 to 2.0V,
Bias V = 4.5 to 5.5V
VCC = 4.5 to 5.5V, Bn = 0 to 2.0 V,
Bias V = 4.5 to 5.5V
B0 – B8 = 0V, Bias V = 5.0V
LIMITS
MIN
NOM
MAX
4.5
5.5
1
10
1.62
2.1
UNIT
V
mA
µA
V
AC ELECTRICAL CHARACTERISTICS
A PORT LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C
VCC = 5V
CL = 50pF, CL = 500Ω
MIN
TYP MAX
Tamb = –40°C to +85°C
VCC = 5V ± 10%
CL = 50pF, CL = 500Ω
MIN
MAX
UNIT
tPLH
Propagation delay
tPHL
Bn to An
Waveform 2
2.0
3.6
6.5
2.0
1.8
3.5
6.1
1.8
7.3
6.7
ns
tPLH
Propagation delay,
tPHL
BCLK1 to ACLK1
Waveform 2
2.0
3.8
6.5
2.0
1.8
3.6
6.1
1.8
7.3
ns
6.7
tPLH
Propagation delay
tPHL
BCLK1 to ACLKin
Waveform 2
2.0
3.7
6.5
2.0
1.8
3.7
6.1
1.8
7.3
ns
6.7
tPLH
Propagation delay
tPHL
BCLK2 to ACLK2
Waveform 2
2.0
3.7
6.5
2.0
1.8
3.9
6.1
1.8
7.3
ns
6.7
tPLH
Propagation delay
tPHL
BCLK2 to AFP
Waveform 2
2.0
3.8
6.5
2.0
1.8
3.9
6.1
1.8
7.3
ns
6.7
tPZH
Output Enable time
tPLZ
OEA1, OEA2, IEA to An
Waveform 1, 2
2.0
3.8
6.5
2.0
1.8
2.5
6.1
1.8
7.3
ns
6.7
tPHZ
Output Disable time
tPLZ
OEA1, OEA2, IEA to An
Waveform 4, 5
1.6
2.5
5.6
1.4
2.0
3.3
7.8
1.8
5.7
ns
8.2
tTLH
Output transition time, An Port
tTHL
10% to 90%, 90% to 10%
Test Circuit and
Waveforms
3.0
7.0
ns
1.7
4.0
tSK(p)
Pulse skew2
|tPHL – tPLH| MAX
Waveform 3
2.0
ns
NOTES:
1. | tPN actual – tPM actual | for any data input to output path compared to any other data input to output path where N and M are either LH or
HL. Skew times are valid only under same test conditions (temperature, VCC, loading, etc.).
2. tSK(p) is used to quantify duty cycle characteristics. In essence it compares the input signal duty cycle to the corresponding output signal
duty cycle. (50MHz input frequency and 50% duty cycle, tested on data paths only).
1995 Jun 16
8