74ABTL3205 Datasheet, PDF (7/14 Pages) NXP Semiconductors – 10-bit BTL transceiver with registers

Philips Semiconductors
10-bit BTL transceiver with registers
Product specification
74ABTL3205
DC ELECTRICAL CHARACTERISTICS
Over recommended operating free-air temperature range unless otherwise noted.
SYMBOL
PARAMETER
LIMITS
TEST CONDITIONS¹
UNIT
MIN
TYP²
MAX
I_OH
High level output current
I_OFF
Power-off output current
V_OH
High-level output voltage
V_OL
Low-level output voltage
V_IK
Input clamp voltage
I_I
Input current at maximum
input voltage
I_IH
High-level input current
I_IL
I_OZH
I_OZL
I_OS
Low-level input current
Off-state output current
Off-state output current
Short-circuit output
current³
BTL
V_CC = MAX, V_IL = MAX,
V_IH = MIN, V_OH = 1.9V
0.5
100
µA
BTL
V_CC = 0.0V, V_IL = MAX,
V_IH = MIN, V_OH = 1.9V
V_CC = MIN, V_IL = MAX,⁴
V_IH = MIN, I_OH = –3mA
2.5
TTL
V_CC = MIN to MAX, ⁴
V_IL = MAX, V_IH = MIN,
I_OH = –10µA
10
100
µA
2.85
3.4
V
V_CC – 1.1
V
TTL
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = 24mA
0.35
0.5
V
BTL
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = 100mA
0.75
1.0
1.10
V
V_CC = MIN, V_IL = MAX,
V_IH = MIN, I_OL = 4mA
0.5
0.7
V
TTL
V_CC = MIN, I_I = I_IK
0.8
–1.2
V
BTL
V_CC = MIN, I_I = –18mA
0.8
–1.2
V
TTL
V_CC = MAX,
V_I = 0.5V or 5.5V
TTL
V_CC = MAX, V_I = 2.7V,
Bn = AIn = 0V
0.1
±50
µΑ
0.1
20
µΑ
BTL
V_CC = MAX, V_I = 1.9V
V_CC = MAX, V_I = 3.5V⁵
100
TTL
V_CC = MAX, V_I = 0.5V
BTL
V_CC = MAX, V_I = 0.75V
TTL
V_CC = MAX, V_O = 2.7V
0.1
100
µΑ
mA
0.1
–20
µΑ
0.1
–100
µΑ
0.1
50
µΑ
TTL
V_CC = MAX, V_O = 0.5V
20
–50
µΑ
TTL
V_CC = MAX, V_O = 0.0V
–60
130
–150
mA
Recmode Low
Tranmode Low
V_CC = MAX
1
3
mA
Recmode Low V_CC = MAX
Tranmode High Mode = Low
7
12
mA
I_CC
Supply current (total)
Recmode Low V_CC = MAX
Tranmode High Mode = High
13
21
mA
Recmode High
Tranmode Low
V_CC = MAX
18
25
mA
Recmode High
Tranmode High
V_CC = MAX
29
43
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
4. Due to test equipment limitations, actual test conditions are V_IH = 1.8V and V_IL = 1.3V for the B side.
5. For B port input voltage between 3 and 5 volts I_IH will be greater than 100µA, but the parts will continue to function normally.
TTL signals CLKin, CLK-1/CLK-OUT, CLK-2/FP-OUT, /FP-IN, /PARITY t,A0..A7, OEB, MASTER/SLAVE, MODE, OEA1, OEA2
BTL signals CLK1BTL, CLK2BTL, B0..B7
1995 Jun 16
7