74ABT544 Datasheet, PDF (8/19 Pages) NXP Semiconductors – Octal latched transceiver with dual enable, inverting 3-State

Philips Semiconductors
74ABT544
Octal latched transceiver with dual enable; inverting; 3-state
Table 7: Static characteristics …continued
At recommended operating conditions; voltages are referenced to GND (ground = 0 V).
Symbol Parameter
Conditions
Min Typ Max Unit
I_LI
input leakage current
control pins
V_CC = 5.5 V; V_I = GND or 5.5 V
-
-
±1.0 µA
data pins
-
-
±100 µA
I_OFF
power-down leakage current
V_CC = 0 V; V_I or V_O ≤ 4.5 V
-
-
±100 µA
I_PU, I_PD power-up or power-down 3-state V_CC = 2.1 V; V_O = 0.5 V; V_I = GND or V_CC; ^[2] -
-
±50 µA
output current
V_OExx = don’t care
I_OZ
3-state output current
V_CC = 5.5 V; V_I = V_IL or V_IH
output HIGH-state at V_O = 2.7 V
-
-
50
µA
output LOW-state at V_O = 0.5 V
-
-
−50 µA
I_CEX
output HIGH-state leakage
V_CC = 5.5 V; V_O = 5.5 V; V_I = GND or V_CC
-
-
50
µA
current
I_O
output current
I_CC
quiescent supply current
V_CC = 5.5 V; V_O = 2.5 V
V_CC = 5.5 V; V_I = GND or V_CC
outputs HIGH-state
[3] _{−50 -}
-
-
−180 mA
250 µA
outputs LOW-state
-
-
30
mA
outputs 3-state
-
-
250 µA
∆I_CC
additional supply current per
V_CC = 5.5 V; one input at 3.4 V and other ^[4] -
-
1.5 mA
input pin
inputs at V_CC or GND; V_CC = 5.5 V
[1] For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
[2] This parameter is valid for any V_CC between 0 V and 2.1 V, with a transition time of up to 10 ms. From V_CC = 2.1 V to V_CC = 5 V ± 10 %
a transition time of up to 100 µs is permitted.
[3] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[4] This is the increase in supply current for each input at 3.4 V.
11. Dynamic characteristics
Table 8: Dynamic characteristics
GND = 0 V; for test circuit see Figure 10.
Symbol Parameter
T_amb = 25 °C; V_CC = 5.0 V
t_PLH
propagation delay
An to Bn, Bn to An
LEBA to An, LEAB to Bn
t_PHL
propagation delay
An to Bn, Bn to An
LEBA to An, LEAB to Bn
t_PZH
output enable time to HIGH-level
OEBA to An, OEAB to Bn
EBA to An, EAB to Bn
t_PZL
output enable time to LOW-level
OEBA to An, OEAB to Bn
EBA to An, EAB to Bn
9397 750 14756
Product data sheet
Conditions
see Figure 5
see Figure 5 and 6
see Figure 5
see Figure 5 and 6
see Figure 7
see Figure 7
see Figure 8
see Figure 8
Rev. 03 — 20 April 2005
Min
Typ
Max Unit
1.7
3.0
3.8
ns
2.1
3.5
4.2
ns
2.4
3.6
4.5
ns
3.0
4.4
5.3
ns
1.8
3.0
3.9
ns
1.9
3.4
4.1
ns
2.9
4.2
5.2
ns
3.1
4.6
5.5
ns
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
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