74HC2GU04_15 Datasheet, PDF (7/16 Pages) NXP Semiconductors – Dual unbuffered inverter

NXP Semiconductors
74HC2GU04
Dual unbuffered inverter
Table 9.
Input
V_M
0.5V_CC
Measurement points
V_I
GND to V_CC
t_r = t_f
6.0 ns
Output
V_M
0.5V_CC
38/6(
9_,
*(1(5$725
9_&&
'87
5₇
9_&&
9₂
5_/ Nȍ
&_/ S)
RSHQ
PJN
Fig 6.
Test data is given in Table 10.
Definitions test circuit:
R_L = Load resistance.
C_L = Load capacitance including jig and probe capacitance.
R_T = Termination resistance should be equal to output impedance Z_o of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Input
V_I
GND to V_CC
t_r, t_f
6 ns
13. Additional characteristics
Test
t_PHL, t_PLH
open
5ELDV Nȍ
9_&&
—) _LQSXW
9_,
I N+]
RXWSXW —)
$ ,2
*1'
PQD
g_fs
=
-^---^I---^o-
V_i
V_O is constant.
Fig 7. Test setup for measuring forward transconductance
74HC2GU04
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 20 August 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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