74F595 Datasheet, PDF (6/13 Pages) NXP Semiconductors – 8-bit shift register with output laches 3-State

Philips Semiconductors
8-bit shift register with output latches (3-State)
Product specification
74F595
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS^{NO TAG}
LIMITS
MIN
TYP
NO TAG
MAX
UNIT
V_OH
V_OL
V_IK
I_I
I_IH
I_IL
I_OZH
±10%V_CC
2.5
V
High-level output voltage
Qs
V_CC = MIN,
V_IL = MAX,
I_OH=–1mA
±5%V_CC
2.7
3.4
V
Q0–Q7
V_IH=MIN
±10%V_CC
I_OH =–3mA _±5%VCC
2.4
2.7
3.3
V
V
Low-level output voltage
Qs
Q0–Q7
V_CC = MIN,
V_IL = MAX,
V_IH = MIN,
I_OL = 20mA
I_OL = 24mA
±10%V_CC
±5%V_CC
±10%V_CC
±5%V_CC
0.30 0.50
V
0.30 0.50
V
0.35 0.50
V
0.35 0.50
V
Input clamp voltage
V_CC = MIN, I_I = I_IK
–0.73 –1.2
V
Input current at maximum input voltage V_CC = MAX, V_I = 7.0V
100
µA
High-level input current
V_CC = MAX, V_I = 2.7V
20
µA
Low-level input current
V_CC = MAX, V_I = 0.5V
–20
mA
Off-state output current,
High level of voltage applied
Q0–Q7
only
V_CC = MAX, V_O = 2.7V
50
µA
I_OZL
Off-state output current,
Low level of voltage applied
Q0–Q7
only
V_CC = MAX, V_O = 0.5V
–50
µA
I_OS
Short-circuit output current^{NO TAG}
V_CC = MAX
–60
–150
mA
I_CCH
55
80
mA
I_CC
Supply current (total)
I_CCL V_CC = MAX
70
100
mA
I_CCZ
65
95
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V_CC = 5V, T_amb = 25°C.
3. Not more than one output should be shorted at a time. For testing I_OS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I_OS tests should be performed last.
1990 Apr 18
6