SA5222 Datasheet, PDF (3/8 Pages) NXP Semiconductors – Low-power FDDI transimpedance amplifier

Philips Semiconductors
Low-power FDDI transimpedance amplifier
Product specification
SA5222
TEST CIRCUITS
SINGLE-ENDED
RT +
VOUT
VIN ^{R +}
2 @ S21 @ R
DIFFERENTIAL
RT +
VOUT
VIN ^{R +}
4 @ S21 @ R
1 + S22
R_O = Z_{O 1 - S22} -20
1 + S22
R_O = 2Z_{O 1 - S22} ^-40
NETWORK ANALYZER
Z_O = 50Ω
50
S-PARAMETER TEST SET
PORT1
PORT2
0.1uF
R=1k
V_CC
20
OUT
IN DUT 20
OUT
.1uF
.1uF
GND₁
GND₂
Z_O = 50Ω
50
SPECTRUM ANALYZER
50Ω
V_CC
20 .1µF
10µF
OUT
IN DUT ₂₀
OUT
.1µF
NE5209
C_S
GND₁
GND₂
10µF
50Ω
Test Circuit 1: Bandwidth
Figure 2. Test Circuit1
TEST CIRCUITS (continued)
SD00361
Test Circuit 2: Noise
Figure 3. Test Circuit2
5V
BIAS TEE
NETWORK ANALYZER
SD00362
S-PARAMETER TEST SET
PORT1
PORT2
50Ω
0.1uF
V_CC
20Ω ^.1uF
OUT
NC
IN DUT _20Ω .1uF
OUT
GND₁
GND₂
100Ω
BAL.
NHO300HB
CAL
50Ω
UNBAL.
Test Circuit 3: PSRR
Figure 4. Test Circuit4
TRANSFORMER
CONVERSION
LOSS = 9dB
SD00363
1995 Apr 26
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