CAT5401WI-25 Datasheet, PDF(6/15 Page) ON Semiconductor – Quad Digitally Programmable Potentiometers with 64 Taps and SPI Interface

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CAT5401WI-25 Datasheet, PDF (6/15 Pages) ON Semiconductor – Quad Digitally Programmable Potentiometers with 64 Taps and SPI Interface

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CAT5401

Power Up Timing (1)(2)

Symbol Parameter

tPUR Power-up to Read Operation

tPUW Power-up to Write Operation

Write Cycle Limits

Symbol Parameter

tWR

Write Cycle Time

Reliability Characteristics

Symbol

NEND(3)

TDR(3)

VZAP(3)

ILTH(3)

Parameter

Endurance

Data Retention

ESD Susceptibility

Latch-Up

Reference Test Method

MIL-STD-883, Test Method 1033

MIL-STD-883, Test Method 1008

MIL-STD-883, Test Method 3015

JEDEC Standard 17

Max Units

Min Max

1,000,000

100

2000

100

Units

Cycles/Byte

Years

Figure 1. Synchronous Data Timing

VIH

SCK

VIL

tCSS

VIH

VIL

VIH

VIL

tWH

tSU

VALID IN

VOH

VOL

HI-Z

tCS

tCSH

tWL

tRI

tFI

tHO

tDIS

HI-Z

Figure 2. HÂ¯Â¯OÂ¯LÂ¯DÂ¯ Timing

SCK

HOLD

tCD

tHD

tCD

tHD

tHZ

HIGH IMPEDANCE

Notes:

tLZ

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(2) tPUR and tPUW are delays required from the time VCC is stable until the specified operation can be initiated.

(3) This parameter is tested initially and after a design or process change that affects the parameter.

(4) Dashed Line = mode (1, 1) - - - - - - -

Doc. No. MD-2012 Rev. I

Characteristics subject to change without notice

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