CAT5251 Datasheet, PDF (6/15 Pages) Catalyst Semiconductor – Quad Digitally Programmable Potentiometer (DPP) with 256 Taps and SPI Interface

CAT5251
WRITE CYCLE LIMITS
Over recommended operating conditions unless otherwise stated.
Symbol Parameter
t_WR
Write Cycle Time
RELIABILITY CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol
N_END ⁽¹⁾
T_DR(1)
V_ZAP(1)
I_LTH(1)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
Min
1,000,000
100
2000
100
Typ Max
5
Units
ms
Typ Max
Units
Cycles/Byte
Years
V
mA
Figure 1. Sychronous Data Timing
V_IH
CS
V_IL
V_IH
SCK
V_IL
V_IH
SI
V_IL
t_CSS
t_WH
t_SU
t_H
VALID IN
V_OH
SO
V_OL
HI-Z
Note: Dashed Line = mode (1, 1)
Figure 2. H¯¯O¯L¯D¯ Timing
CS
SCK
HOLD
SO
t_CD
t_HD
t_HZ
t_CS
t_CSH
t_WL
t_RI
tFI
t_V
t_HO
t_DIS
HI-Z
t_CD
t_HD
HIGH IMPEDANCE
t_LZ
Notes:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
Doc. No. MD-2017 Rev. H
6
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Characteristics subject to change without notice