CAT5221_13 Datasheet, PDF (6/15 Pages) ON Semiconductor – Dual Digital Potentiometer (POT)

CAT5221
Table 10. RELIABILITY CHARACTERISTICS (Over recommended operating conditions unless otherwise stated.)
Symbol
Parameter
Reference Test Method
Min
Typ Max
NEND (Note 9)
Endurance
MIL−STD−883, Test Method 1033 1,000,000
TDR (Note 9)
Data Retention
MIL−STD−883, Test Method 1008
100
VZAP (Note 9)
ESD Susceptibility MIL−STD−883, Test Method 3015
2000
ILTH (Notes 9, 10) Latch-Up
JEDEC Standard 17
100
9. This parameter is tested initially and after a design or process change that affects the parameter.
10. t_PUR and t_PUW are the delays required from the time V_CC is stable until the specified operation can be initiated.
Units
Cycles/Byte
Years
Volts
mA
t_F
t_HIGH
t_R
t_LOW
t_LOW
SCL
t_SU:STA
SDA IN
t_HD:STA
t_HD:DAT
t_SU:DAT
SDA OUT
t_AA
t_DH
Figure 2. Bus Timing
t_SU:STO
t_BUF
SCL
SDA
8TH BIT
BYTE n
ACK
t_WR
STOP
CONDITION
Figure 3. Write Cycle Timing
START
CONDITION
ADDRESS
SDA
SCL
START BIT
Figure 4. Start/Stop Timing
STOP BIT
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