AMIS-39101 Datasheet, PDF (11/12 Pages) AMI SEMICONDUCTOR – Octal High-Side Driver with Protection

AMIS−39101
Data transfer from Diagnostic Register
to Output Register at falling edge WR
WR
Data transfer from Input Register to
Command Register at rising edge WR
CLK
DIN
1
2
3
4
5
6
7
8
CMD1 CMD2 CMD3 CMD4 CMD5 CMD6 CMD7 CMD8
DOUT
HiZ
HiZ
DIAG1
DIAG2 DIAG3 DIAG4 DIAG5 DIAG6 DIAG7 DIAG8
X
OUT
OUT 1 TO 8
Figure 7. Timing Diagram
Quality and Reliability
A quality system with certification against TS16949 is
maintained.
An AEC−Q100 compatible product qualification is
performed. Monitoring of production is performed
according to the dedicated AMIS specifications for
assembly and wafer fabrication.
All products are tested using a production test program.
Lot conformance to specification in volume production is
guaranteed by means of following quality conformance
tests:
Table 13. QUALIFICATION
QC Test
Conditions
Electrical functional
and parametric
To product data sheet
External visual
(mechanical)
Physical damage to body or leads (e.g. bent leads)
Dimensions affecting PCB manufacturability
(e.g. coplanarity)
External visual
(cosmetic)
Correctness of marking
All other cosmetic defects
NOTE: Each production lot will be accompanied with a Certificate of Conformance.
AQL Level
0.04
0.15
0.65
Inspection Level
II
II
II
Company or Product Inquiries
For more information about ON Semiconductor’s products or services visit our Web site at http://www.onsemi.com.
http://onsemi.com
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