74HC2GU04 Datasheet, PDF (7/15 Pages) NXP Semiconductors – Dual unbuffered inverter

NXP Semiconductors
74HC2GU04
Dual unbuffered inverter
Table 9.
Input
V_M
0.5V_CC
Measurement points
V_I
GND to V_CC
t_r = t_f
6.0 ns
Output
V_M
0.5V_CC
V_I
PULSE
GENERATOR
V_CC
D.U.T
R_T
V_CC
V_O
R_L = 1 kΩ
C_L 50 pF
open
mgk563
Test data is given in Table 10.
Definitions test circuit:
R_L = Load resistance.
C_L = Load capacitance including jig and probe capacitance.
R_T = Termination resistance should be equal to output impedance Z_o of the pulse generator.
Fig 6. Load circuitry for switching times
Table 10. Test data
Input
V_I
GND to V_CC
t_r, t_f
6 ns
13. Additional characteristics
Test
t_PHL, t_PLH
open
Rbias = 560 kΩ
V_CC
0.47 µF _input
V_I
(f = 1 kHz)
output 100 µF
A IO
GND
mna050
g _fs = _∆-^∆---_V-^I--^o-_i
V_O is constant.
Fig 7. Test set-up for measuring forward transconductance
74HC2GU04_1
Product data sheet
Rev. 01 — 6 October 2006
© NXP B.V. 2006. All rights reserved.
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