74HC2GU04 Datasheet, PDF (10/15 Pages) NXP Semiconductors – Dual unbuffered inverter

NXP Semiconductors
74HC2GU04
Dual unbuffered inverter
R1
U04
R2
C1
C2
out
mna053
Test data is given in Table 11 and Table 12.
C1 = 47 pF.
C2 = 22 pF.
R1 = 1 MΩ to 10 MΩ.
R2 optimum value depends on the frequency and required stability against changes in V_CC or average minimum I_CC
(I_CC = 2 mA at V_CC = 3.0 V and f = 1 MHz).
Fig 13. Crystal oscillator application
Table 11. External components for resonator (f < 1 MHz)
Frequency
R1
R2
10 kHz to 15.9 kHz
2.2 MΩ
220 kΩ
16 kHz to 24.9 kHz
2.2 MΩ
220 kΩ
25 kHz to 54.9 kHz
2.2 MΩ
100 kΩ
55 kHz to 129.9 kHz
2.2 MΩ
100 kΩ
130 kHz to 199.9 kHz
2.2 MΩ
47 kΩ
200 kHz to 349.9 kHz
2.2 MΩ
47 kΩ
350 kHz to 600 kHz
2.2 MΩ
47 kΩ
C1
56 pF
56 pF
56 pF
47 pF
47 pF
47 pF
47 pF
Table 12. Optimum value for R2
Frequency
R2
Optimum
3 kHz
6 kHz
10 kHz
14 kHz
2.0 kΩ
8.0 kΩ
1.0 kΩ
4.7 kΩ
0.5 kΩ
2.0 kΩ
0.5 kΩ
2.0 kΩ
for minimum required I_CC
for minimum influence due to change in V_CC
or minimum required I_CC
or minimum influence by V_CC
or minimum required I_CC
or minimum influence by V_CC
or minimum required I_CC
or minimum influence by V_CC
> 14 kHz
replace R2 by C3 = 35 pF (typical)
C2
20 pF
10 pF
10 pF
5 pF
5 pF
5 pF
5 pF
74HC2GU04_1
Product data sheet
Rev. 01 — 6 October 2006
© NXP B.V. 2006. All rights reserved.
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