English
Language : 

UJA1061 Datasheet, PDF (63/74 Pages) NXP Semiconductors – Low speed CAN/LIN system basis chip
NXP Semiconductors
UJA1061
Fault-tolerant CAN/LIN fail-safe system basis chip
Table 27. Dynamic characteristics[1] (Continued)
Tvj = −40 °C to + 150 °C; VBAT42 = 5.5 V to 52 V; VBAT14 = 5.5 V to 27 V; VBAT42 ≥ VBAT14 − 1 V; unless otherwise specified. All
voltages are defined with respect to ground. Positive currents flow into the IC.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Battery monitoring
tBAT42(L)
BAT42 LOW time for
setting PWONS
5
-
20
µs
Power supply V1; pin V1
tV1(CLT)
V1 clamped LOW
time during ramp-up
of V1
Start-up mode; V1 active
229
-
283
ms
Power supply V2; pin V2
tV2(CLT)
V2 clamped LOW
time during ramp-up
of V2
V2 active
28
-
36
ms
Power supply V3; pin V3
tW(CS)
cyclic sense period
V3C = 10; see Figure 13
V3C = 11; see Figure 13
14
-
28
-
18
ms
36
ms
ton(CS)
cyclic sense on-time V3C = 10; see Figure 13
V3C = 11; see Figure 13
345
-
345
-
423
µs
423
µs
Wake-up input; pin WAKE
tWU(ipf)
tsu(CS)
input port filter time VBAT42 = 5 V to 27 V
5
-
VBAT42 = 27 V to 52 V
30
-
cyclic sense sample V3C = 11 or 10; see Figure 13
310
-
setup time
120
µs
250
µs
390
µs
Watchdog
tWD(ETP)
earliest watchdog
trigger point
programmed Nominal
Watchdog Period (NWP);
Normal mode
0.45 ×
-
NWP
0.55 ×
NWP
tWD(LTP)
latest watchdog
trigger point
programmed nominal
watchdog period; Normal
mode, Standby mode and
Sleep mode
0.9 × NWP -
1.1 × NWP
tWD(init)
watchdog initializing watchdog time-out in Start-up
229
-
period
mode
283
ms
Fail-safe mode
tret
retention time
Fail-safe mode; wake-up
1.3
1.5
1.7
s
detected
Reset output; pin RSTN
tRSTN(CHT)
clamped HIGH time, RSTN driven LOW internally
pin RSTN
but RSTN pin remains HIGH
115
-
141
ms
tRSTN(CLT)
clamped LOW time, RSTN driven HIGH internally
pin RSTN
but RSTN pin remains LOW
229
-
283
ms
tRSTN(INT)
interrupt monitoring INTN = 0
time
229
-
283
ms
UJA1061_5
Product data sheet
Rev. 05 — 22 November 2007
© NXP B.V. 2007 Nov 23. All rights reserved.
63 of 74