PRTR5V0U1T Datasheet, PDF (5/11 Pages) NXP Semiconductors – Ultra low capacitance single rail-to-rail ESD protection

NXP Semiconductors
PRTR5V0U1T
Ultra low capacitance single rail-to-rail ESD protection
ESD TESTER
R_Z
C_Z
IEC 61000-4-2 network
C_Z = 150 pF; R_Z = 330 Ω
450 Ω
RG 223/U
50 Ω coax
DUT
Device
Under
Test
10×
ATTENUATOR
4 GHz DIGITAL
OSCILLOSCOPE
50 Ω
vertical scale = 200 V/div
horizontal scale = 50 ns/div
vertical scale = 10 V/div
horizontal scale = 50 ns/div
GND
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
GND
GND
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
vertical scale = 10 V/div
horizontal scale = 50 ns/div
GND
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
Fig 3. ESD clamping test setup and waveforms
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
006aab112
PRTR5V0U1T_1
Product data sheet
Rev. 01 — 25 September 2008
© NXP B.V. 2008. All rights reserved.
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