PRTR5V0U2D Datasheet, PDF (3/12 Pages) NXP Semiconductors – Ultra low capacitance double rail-to-rail ESD protection

NXP Semiconductors
PRTR5V0U2D
Ultra low capacitance double rail-to-rail ESD protection
5. Limiting values
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter
Conditions
Min
Per device
T_amb
ambient temperature
−40
T_stg
storage temperature
−55
Max Unit
+85
°C
+125 °C
Table 6. ESD maximum ratings
T_amb = 25 °C unless otherwise specified.
Symbol Parameter
Per channel
V_ESD
electrostatic discharge voltage
Conditions
IEC 61000-4-2
(contact discharge)
MIL-STD-883 (human
body model)
[1] Device stressed with ten non-repetitive ESD pulses.
[2] Measured from pin 1, 3, 4 or 6 to pin 2 or 5.
Min Max Unit
[1][2] _-
[2] _-
8
kV
10 kV
PRTR5V0U2D_1
Product data sheet
Rev. 01 — 28 April 2009
© NXP B.V. 2009. All rights reserved.
3 of 12