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DS92LV010AEP Datasheet, PDF (6/12 Pages) National Semiconductor (TI) – Bus LVDS 3.3/5.0V Single Transceiver
Electrical Characteristics
Note 4: “Absolute Maximum Ratings” are these beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device should
be operated at these limits. The table of “Electrical Characteristics” provides conditions for actual device operation.
Note 5: All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground except VOD, VID, VTH
and VTL unless otherwise specified.
Note 6: All typicals are given for VCC = +3.3V or 5.0 V and TA = +25°C, unless otherwise stated.
Note 7: ESD Rating: HBM (1.5 kΩ, 100 pF) > 2.0 kV EAT (0Ω, 200 pF) > 300V.
Note 8: CL includes probe and fixture capacitance.
Note 9: Generator waveforms for all tests unless otherwise specified: f = 1MHz, ZO = 50Ω, tr, tf ≤ 6.0ns (0%–100%) on control pins and ≤ 1.0ns for RI inputs.
Note 10: The DS92LV010AEP is a current mode device and only function with datasheet specification when a resistive load is applied between the driver outputs.
Note 11: For receiver TRI-STATE® delays, the switch is set to VCC for tPZL, and tPLZ and to GND for tPZH, and tPHZ.
Note 12: "Testing and other quality control techniques are used to the extent deemed necessary to ensure product performance over the specified temperature
range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific
PARAMETRIC testing, product performance is assured by characterization and/or design."
Test Circuits and Timing Waveforms
FIGURE 1. Differential Driver DC Test Circuit
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FIGURE 2. Differential Driver Propagation Delay and Transition Time Test Circuit
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FIGURE 3. Differential Driver Propagation Delay and Transition Time Waveforms
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201193 Version 3 Revision 1 Print Date/Time: 2009/06/15 11:42:19