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THS4511-SP Datasheet, PDF (13/25 Pages) Texas Instruments – RAD-TOLERANT CLASS V, WIDEBAND, FULLY DIFFERENTIAL AMPLIFIER
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TEST CIRCUITS
The THS4511 is tested with the following test circuits.
For simplicity, the power supply decoupling is not
shown – see the layout in the application information
section for recommendations. Depending on the test
conditions, component values are changed per the
following tables, or as otherwise noted. The signal
generators used are ac coupled 50 Ω sources, and a
0.22 μF capacitor and a 49.9 Ω resistor to ground are
inserted across RIT on the alternate input to balance
the circuit.
Table 1. Gain Component Values
GAIN
6 dB
10 dB
14 dB
20 dB
RF
348 Ω
348 Ω
348 Ω
348 Ω
RG
165 Ω
100 Ω
56.2 Ω
16.5 Ω
RIT
61.9 Ω
69.8 Ω
88.7 Ω
287 Ω
Note: The gain setting includes 50 Ω source
impedance. Components are chosen to achieve
gain and 50 Ω input termination.
Table 2. Load Component Values
RL
100 Ω
200 Ω
499 Ω
1k Ω
RO
25 Ω
86.6 Ω
237 Ω
487 Ω
ROT
open
69.8 Ω
56.2 Ω
52.3 Ω
Atten
6 dB
16.8 dB
25.5 dB
31.8 dB
Note: The total load includes 50 Ω termination by
the test equipment. Components are chosen to
achieve load and 50 Ω line termination through a
1:1 transformer.
Due to the voltage divider on the output formed by
the load component values, the amplifier's output is
attenuated. The column Atten in Table 2 shows the
attenuation expected from the resistor divider. When
using a transformer at the output as shown in
Figure 31, the signal will see slightly more loss, and
these numbers will be approximate.
Frequency Response
The circuit shown in Figure 30 is used to measure the
frequency response of the circuit.
A network analyzer is used as the signal source and
as the measurement device. The output impedance
of the network analyzer is 50 Ω. RIT and RG are
chosen to impedance match to 50 Ω, and to maintain
the proper gain. To balance the amplifier, a 0.22 μF
capacitor and 49.9 Ω resistor to ground are inserted
across RIT on the alternate input.
THS4511–SP
SLOS538A – SEPTEMBER 2007 – REVISED OCTOBER 2007
The output is probed using a high-impedance
differential probe across the 100 Ω resistor. The gain
is referred to the amplifier output by adding back the
6 dB loss due to the voltage divider on the output.
From VIN
50 W
Source
RG
RIT
0.22 mF
49.9 W
RG
RIT
RF
5V
THS4511
CM
49.9 W
49.9 W 100 W
Open
0.22 mF
Output Measured
Here With High-
Impedance
Differential Probe
RF
Figure 30. Frequency Response Test Circuit
Distortion
The circuit shown in Figure 31 is used to measure
harmonic distortion and intermodulation distortion of
the amplifier.
A signal generator is used as the signal source, and
the output is measured with a spectrum analyzer. The
output impedance of the signal generator is 50 Ω. RIT
and RG are chosen to impedance-match to 50 Ω and
to maintain the proper gain. To balance the amplifier,
a 0.22 μF capacitor and 49.9 Ω resistor to ground are
inserted across RIT on the alternate input.
A low-pass filter is inserted in series with the input to
reduce harmonics generated at the signal source.
The level of the fundamental is measured, then a
high-pass filter is inserted at the output to reduce the
fundamental so that it does not generate distortion in
the input of the spectrum analyzer.
The transformer used in the output to convert the
signal from differential to single ended is an
ADT1-1WT. It limits the frequency response of the
circuit so that measurements cannot be made below
approximately 1 MHz.
From VIN
50 W
Source
RG
RIT
RG
RF
5V
THS4511
RO
1:1 VOUT To 50 W
Test
RO
ROT
Equipment
0.22 mF
RIT
49.9 W
CM
RF
Open
0.22 mF
Figure 31. Distortion Test Circuit
Slew Rate, Transient Response, Settling Time,
Output Impedance, Overdrive, Output Voltage,
Copyright © 2007, Texas Instruments Incorporated
Product Folder Link(s): THS4511–SP
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