HAL856 Datasheet, PDF (12/42 Pages) Micronas – Programmable Linear Hall-Effect Sensor with Arbitrary Output Characteristic (2-Wire)

HAL 856
DATA SHEET
Output Characteristic
The OUTPUT CHARACTERISTIC register defines the
shape of the sensor output signal. It consists of
32 setpoints. Each setpoint can be set to values
between 0 and 511 LSB. The output characteristic has
to be monotonic increasing (Setpoint0 ≤ Setpoint1
≤ SetpointN).
LOCKR
By setting this 1-bit register, all registers will be locked,
and the sensor will no longer respond to any supply
voltage modulation. This bit is active after the first
power-off and power-on sequence after setting the
LOCK bit.
Warning: This register cannot be reset!
Digital Output
This 12-bit register delivers the actual digital value of
the applied magnetic field after the signal processing.
This register can only be read out, and it is the basis
for the calibration procedure of the sensor in the sys-
tem environment.
Offset Correction
The OFFSET CORRECTION register allows to adjust
the digital offset of the built-in A/D-converter. The digi-
tal offset can be programmed to −3/4, −1/2, −1/4, 0,
+1/4, +1/2, +3/4 of full-scale.
Table 2–6: OFFSET CORRECTION register definition
Offset Correction
−3/4
−1/2
−1/4
0
1/4
1/2
3/4
Bit Setting
28
29
30
0
17
18
19
Slew Rate
The SLEW RATE register is a “sub”-register of the
CURRENTSOURCE register. The output signal fall
and rise time of the HAL856 depends on the SLEW
RATE register setting and the external load circuit.
Table 2–7: SLEW RATE register definition
Typ. Values (Sensor Only)
Rise time
[µs/mA]
Fall time
[µs/mA]
0.05
0.1
0.3
0.6
0.5
1.1
0.8
1.6
Bit Setting
0
1
2
3
Note: The slew rate can be programmed to optimize
the EMI behavior of the application. The differ-
ential current change has a Gaussian shape for
low emission.
Please contact Micronas Application Support in
case further slew rates are required.
Fig. 2–5: Typical I_DD vs. slew rate for setting “slowest
slew rate”
Note: Using the Offset Correction will change the
Micronas trimming of the LSB adjusted offset.
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March 23, 2010; DSH000142_002EN
Micronas