MT28F160A3 Datasheet, PDF (19/28 Pages) Micron Technology – FLASH MEMORY

ADVANCE
1 MEG x 16
ENHANCED BOOT BLOCK FLASH MEMORY
AC TEST CONDITIONS
Input pulse levels .................................................. 0V to VCCQ
Input rise and fall times ................................................ <10ns
Input timing reference level ....................................... VCCQ/2
Output timing reference level .................................... VCCQ/2
Output load ............................................................. CL = 30pF
Figure 7
AC Test Output and Load Circuit
0.1mA
IOL
VCCQ
2
CL = 30pf ¹
Output
under
test
-0.1mA
IOH
Figure 8
AC Input/Output Reference Waveform
VCCQ
Input
0.0V
VCCQ
2
Test Points Test Points
NOTE: 1. CL includes probe and fixture capacitance.
VCCQ _Output
2
1 Meg x 16 Enhanced Boot Block Flash Memory
MT28F160A3_3.p65 – Rev. 3, Pub. 8/01
19
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