English
Language : 

MAX106 Datasheet, PDF (13/32 Pages) Maxim Integrated Products – ±5V, 600Msps, 8-Bit ADC with On-Chip 2.2GHz Bandwidth Track/Hold Amplifier
±5V, 600Msps, 8-Bit ADC with On-Chip
2.2GHz Bandwidth Track/Hold Amplifier
Principle of Operation
The MAX106’s flash or parallel architecture provides
the fastest multibit conversion of all common integrated
ADC designs. The key to this high-speed flash archi-
tecture is the use of an innovative, high-performance
comparator design. The flash converter and down-
stream logic translate the comparator outputs into a
parallel 8-bit output code and pass this binary code on
to the optional 8:16 demultiplexer, where primary and
auxiliary ports output PECL-compatible data at up to
300Msps per port (depending on how the demultiplex-
er section is set on the MAX106). The ideal transfer
function appears in Figure 2.
On-Chip Track/Hold Amplifier
As with all ADCs, if the input waveform is changing
rapidly during conversion, ENOB and signal-to-noise
ratio (SNR) specifications will degrade. The MAX106’s
on-chip, wide-bandwidth (2.2GHz) T/H amplifier reduces
this effect and increases the ENOB performance signifi-
cantly, allowing precise capture of fast analog data at
high conversion rates.
The T/H amplifier buffers the input signal and allows a
full-scale signal input range of ±250mV. The T/H ampli-
fier’s differential 50Ω input termination simplifies inter-
facing to the MAX106 with controlled impedance lines.
Figure 3 shows a simplified diagram of the T/H amplifier
stage internal to the MAX106.
Aperture width, delay, and jitter (or uncertainty) are
parameters that affect the dynamic performance of
high-speed converters. Aperture jitter, in particular,
directly influences SNR and limits the maximum slew
rate (dV/dt) that can be digitized without a significant
contribution of errors. The MAX106’s innovative T/H
amplifier design typically limits aperture jitter to less
than 0.5ps.
Aperture Width
Aperture width (tAW) is the time the T/H circuit requires
(Figure 4) to disconnect the hold capacitor from the
input circuit (for instance to turn off the sampling bridge
and put the T/H unit in hold mode).
Aperture Jitter
Aperture jitter (tAJ) is the sample-to-sample variation
(Figure 4) in the time between the samples.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 4).
OVERRANGE + 255
255
254
129
128
127
126
3
2
1
0
0
ANALOG INPUT
Figure 2. Transfer Function
ALL INPUTS ARE ESD PROTECTED
(NOT SHOWN IN THIS
SIMPLIFIED DRAWING).
INPUT SAMPLING
AMPLIFIER BRIDGE
VIN+
VIN-
50Ω
50Ω
BUFFER
AMPLIFIER
CHOLD
TO
COMPARATORS
GNDI
GNDI
CLK+
CLK-
50Ω
CLOCK
SPLITTER
50Ω
TO
COMPARATORS
CLKCOM
Figure 3. Internal Structure of the 2.2GHz T/H Amplifier
CLK
CLK
tAW
ANALOG
INPUT
tAD
tAJ
SAMPLED
DATA (T/H)
T/H TRACK
HOLD
TRACK
APERTURE DELAY (tAD)
APERTURE WIDTH (tAW)
APERTURE JITTER (tAJ)
Figure 4. T/H Aperture Timing
______________________________________________________________________________________ 13