IS62WV10248EALL Datasheet, PDF (12/15 Pages) Integrated Silicon Solution, Inc – Data control for upper and lower bytes

IS62WV10248EALL/BLL
IS65WV10248EALL/BLL
DATA RETENTION CHARACTERISTICS
Symbol Parameter
Test Condition
OPTION
V_DR
V_DD for Data
See Data Retention Waveform IS62(5)WV10248EALL
Retention
IS62(5)WV10248EBLL
I_DR
Data Retention V_DD= V_DR(min),
Current
(1) 0V ≤ CS2 ≤ 0.2V, or
(2)
≥ V_DD – 0.2V,
CS2 ≥ V_DD - 0.2V
Com.
Ind.
Auto
t_SDR
Data Retention See Data Retention Waveform
Setup Time
t_RDR
Recovery Time See Data Retention Waveform
Note:
1. Typical values are measured at VDD=VDR(min), TA = 25℃ and not 100% tested.
Min. Typ.⁽¹⁾ Max. Unit
1.5
-
V
1.5
-
V
-
-
20 uA
-
-
25
-
-
50
0
-
- ns
tRC -
- ns
DATA RETENTION WAVEFORM ( CONTROLLED)
tSDR
DATA RETENTION MODE
tRDR
VDD
VDR
GND
> VDD-0.2V
DATA RETENTION WAVEFORM (CS2 CONTROLLED)
VDD
CS2
VDR
GND
DATA RETENTION MODE
tSDR
tRDR
CS2 < 0.2V
Integrated Silicon Solution, Inc.- www.issi.com
12
Rev. B
10/21/2014