JANTXVR2N7261U Datasheet, PDF (3/12 Pages) International Rectifier – RADIATION HARDENED POWER MOSFET SURFCACE MOUNT(LCC-18)

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IRHE713O, JANSR2N7261U
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ÄÅ
Parameter
100K Rads(Si)¹
300 - 1000K Rads (Si)² Units
Min Max Min Max
Test Conditions
BV_DSS Drain-to-Source Breakdown Voltage
100
VGS(th) Gate Threshold Voltage
2.0
I_GSS
Gate-to-Source Leakage Forward —
I_GSS
Gate-to-Source Leakage Reverse —
I_DSS
Zero Gate Voltage Drain Current
—
R_DS(on) Static Drain-to-Source Ã
—
On-State Resistance (TO-3)
R_DS(on) Static Drain-to-Source Ã
—
On-State Resistance (LCC-18)
V_SD
Diode Forward Voltage Ã
—
—
4.0
100
-100
25
0.18
0.18
1.5
100 — _V
1.25 4.5
—
100 _nA
— -100
—
50 µA
— 0.24 Ω
— 0.24 Ω
—
1.5 V
V_GS = 0V, I_D = 1.0mA
VGS = V_DS, I_D = 1.0mA
V_GS = 20V
V_GS = -20 V
V_DS=80V, V_GS =0V
VGS = 12V, I_D =5.0A
VGS = 12V, I_D =5.0A
V_GS = 0V, IS = 8.0A
1. Part number IRHE7130 (JANSR2N7261U)
2. Part numbers IRHE3130 (JANSF2N7261U), IRHE4130 (JANSG2N7261U) and IRHE8130 (JANSH2N7261U)
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Single Event Effect Safe Operating Area
Ion
LET
Energy
(MeV/(mg/cm²)) (MeV)
Cu
28
285
Br
36.8
305
Range
(µm)
43
39
VDS(V)
@VGS=0V @VGS=-5V @VGS=-10V @VGS=-15V @VGS=-20V
100
100
100
80
60
100
90
70
50
—
120
100
80
Cu
60
Br
40
20
0
0
-5
-10
-15
-20
-25
VGS
Fig a. Single Event Effect, Safe Operating Area
For footnotes refer to the last page
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