ISL54200 Datasheet, PDF (8/18 Pages) Intersil Corporation – USB 2.0 High/Full Speed Multiplexer

ISL54200
Test Circuits and Waveforms (Continued)
VDD
C
EN
HSx or FSx
SIGNAL
GENERATOR
VDD
C
EN
HSx
COMx
45Ω
IMPEDANCE
ANALYZER
IN
IN
COMx
VINL OR
VINH
VIN
GND
COMx
FSx
ANALYZER
NC
GND
RL
Repeat test for all switches.
FIGURE 5. CAPACITANCE TEST CIRCUIT
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 6. CROSSTALK TEST CIRCUIT
VDD
C
t_ri
DIN+
DIN-
10%
90%
50%
t_{skew_i}
90%
50%
10%
t_fi
t_ro
VIN
DIN+
15.8Ω
143Ω
DIN-
15.8Ω
143Ω
EN
VIN
COMD2
COMD1
D2
OUT+
CL ^45Ω
D1
OUT-
CL ^45Ω
90%
OUT+
OUT-
10%
90%
50%
t_{skew_o}
50%
t_f0 ^10%
GND
|tro-tri| Delay Due to Switch for Rising Input and Rising Output
Signals.
|tfo-tfi| Delay Due to Switch for Falling Input and Falling Output
Signals.
|tskew_0| Change in Skew through the Switch for Output Signa
|tskew_i| Change in Skew through the Switch for Input Signals.
FIGURE 7A. MEASUREMENT POINTS
FIGURE 7B. TEST CIRCUIT
FIGURE 7. SKEW TEST
8
FN6408.2
June 17, 2010