ISL71091SEH10 Datasheet, PDF (7/16 Pages) Intersil Corporation – 10V Radiation Hardened Ultra Low Noise

ISL71091SEH10
Total Dose Radiation Characteristics This data is typical mean test data post total dose radiation exposure
at both low dose rate (LDR) of <10mrad(Si)/s to 50krads and at a high dose rate (HDR) of 50 to 300rad(Si)/s to 150krads. This data is intended to show
typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. LDR data to 150krads will be added when available.
V_IN = 15V, T_A = +25°C, I_OUT = 0, C_IN = 0.1µF, C_L = 1µF and C_COMP = 0.001µF unless otherwise specified.
10.03
10.02
10.01
SPEC LIMIT
0.55
SPEC LIMIT
0.50
0.45
0.40
10.00
HDR GND
0.35 ^{LDR BIASED}
HDR GND
HDR BIASED
9.99
LDR GND
9.98 LDR BIASED
HDR BIASED
9.97
0
SPEC LIMIT
50
100
150
TOTAL DOSE (krad (Si))
FIGURE 5. V_OUT ACCURACY SHIFT
ANNEAL
0.30
0.25
0.20
0.15
0
LDR GND
SPEC LIMIT
50
100
150
TOTAL DOSE (krad (Si))
FIGURE 6. SUPPLY CURRENT SHIFT
ANNEAL
6
SPEC LIMIT
4
2 _{LDR BIASED}
0
-2
LDR GND
HDR GND
HDR BIASED
-4
-6
SPEC LIMIT
0
50
100
150
ANNEAL
TOTAL DOSE (krad (Si))
FIGURE 7. LINE REGULATION SHIFT
20
SPEC LIMIT
15
10
HDR GND
HDR BIASED
5
0
LDR GND
-5
LDR BIASED
-10
-15
-20
0
SPEC LIMIT
50
100
150
TOTAL DOSE (krad (Si))
ANNEAL
FIGURE 8. LOAD REGULATION (SOURCING) SHIFT
50
SPEC LIMIT
40
30
20
HDR BIASED
HDR GND
10
0 _{LDR GND}
-10
LDR BIASED
-20
-30
-40
-500
SPEC LIMIT
50
100
150
TOTAL DOSE (krad (Si))
ANNEAL
FIGURE 9. LOAD REGULATION (SINKING) SHIFT
1.8
SPEC LIMIT
1.6
1.4
HDR GND
HDR BIASED
1.2
1.0
0.8
LDR GND
0.6
LDR BIASED
0.4
0.2
0
0
50
100
150
ANNEAL
TOTAL DOSE (krad (Si))
FIGURE 10. DROPOUT SHIFT
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7
FN8633.2
March 17, 2016