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ISL71091SEH10 Datasheet, PDF (12/16 Pages) Intersil Corporation – 10V Radiation Hardened Ultra Low Noise
ISL71091SEH10
Characterization vs Simulation Results
10.014
10.014
10.010
10.010
10.006
10.006
10.002
10.002
UNIT 1
UNIT 2
UNIT 3
9.998
9.994
9.998
9.994
UNIT 4
UNIT 5
9.990
-65 -45 -25
-5 15 35 55 75
TEMPERATURE (°C)
95 115 135
FIGURE 24. SIMULATED (WORSE CASE) VOUT vs TEMPERATURE
9.990
-65 -45 -25
-5 15 35 55 75
TEMPERATURE (°C)
95 115 135
FIGURE 25. CHARACTERIZED VOUT vs TEMPERATURE
10.004
10.003
10.002
10.001
10.000
VOUT
9.999
9.998
9.997
9.996
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 26. SIMULATED LINE TRANSIENT (VIN = 500mV)
4
3
2
1
VOUT
0
-1
-2
-3
-4
0 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 27. CHARACTERIZED LINE TRANSIENT (VIN = 500mV)
10.100
10.075
10.050
10.025
10.000
VOUT
9.975
9.950
9.925
9.900
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 28. SIMULATED LOAD TRANSIENT (IL = 1mA)
80
60
40
20
VOUT
0
-20
-40
-60
-80
0
0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00
TIME (ms)
FIGURE 29. CHARACTERIZED LOAD TRANSIENT (IL = 1mA)
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FN8633.2
March 17, 2016