DG406_06 Datasheet, PDF (7/13 Pages) Intersil Corporation – Single 16-Channel/Differential 8-Channel, CMOS Analog Multiplexers

DG406, DG407
Test Circuits and Waveforms (Continued)
LOGIC ^3V
INPUT _0V
V_S1B
SWITCH
OUTPUT _0V
V_O
V_S8B
S₁ ON
t_TRANS
50%
50%
80% V_S8
S₈ ON
t_r < 20ns
t_f < 20ns
80% VS1
t_TRANS
FIGURE 1C. MEASUREMENT POINTS
FIGURE 1. TRANSITION TIME
+15V
LOGIC
INPUT V_IN
50Ω
A3
V+
S₁
-5V
A₂
S₂ - S₁₆
A_{1 DG406}
A₀
EN _{GND V-} D
300Ω
-15V
V_O
35pF
FIGURE 2A. DG406 TEST CIRCUIT
+15V
LOGIC
INPUT V_IN
50Ω
A₂
V+ _S1B
-5V
A_{1 DG407}
†
A₀
EN D_A AND D_B
GND V-
300Ω
V_O
35pF
-15V
† = S_1A - S_8A, S_2B - S_8B, D_A
FIGURE 2B. DG407 TEST CIRCUIT
LOGIC
INPUT
V_IN
SWITCH
OUTPUT
V_O
3V
0V
t_ON(EN)
0V
50%
50%
90% V_O
V_O
t_r < 20ns
t_f < 20ns
t_OFF(EN)
FIGURE 2C. MEASUREMENT POINTS
FIGURE 2. ENABLE SWITCHING TIMES
+15V
+2.4V
LOGIC
INPUT
50Ω
EN ^V+ ALL S
A3
AND D_A
A₂ DG406
A₁ ^DG407 _D,
A_{0 GND V-} D_B
+5V (V_S)
300Ω
V_O
35pF
-15V
3V
LOGIC
INPUT
0V
V_S
SWITCH
OUTPUT
V_O
0V
t_r < 20ns
t_f < 20ns
80%
t_OPEN
FIGURE 3A. TEST CIRCUIT
FIGURE 3B. MEASUREMENT POINTS
FIGURE 3. BREAK-BEFORE-MAKE INTERVAL
7
FN3116.9
March 13, 2006