HCS32MS_07 Datasheet, PDF (6/11 Pages) Intersil Corporation – Radiation Hardened Quad 2-Input OR Gate

Total Dose Irradiation
CONFORMANCE GROUPS
Group E Subgroup 2
METHOD
5005
HCS32MS
PRE RAD
1, 7, 9
TEST
POST RAD
DC Post Radiation
Electrical Performance
Characteristics on page 4
NOTES:
13. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
DC Post Radiation
Electrical Performance
Characteristics on
page 4 (Note 13)
Static And Dynamic Burn-In Test Connections
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 14)
3, 6, 8, 11
1, 2, 4, 5, 7, 9, 10, 12,
-
13
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 14)
3, 6, 8, 11
7
-
1, 2, 4, 5, 9, 10, 12, 13,
-
-
14
DYNAMIC BURN-IN TEST CONNECTIONS (Note 15)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9, 10, 12,
-
13
NOTES:
14. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in
15. Each pin except VCC and GND will have a resistor of 1kΩ ± 5% for dynamic burn-in
Irradiation Test Conditions
OPEN
GROUND
VCC = 5V ± 0.5V
3, 6, 8, 11
7
1, 2, 4, 5, 9, 10, 12, 13, 14
NOTES:
16. Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0
failures.
6
FN3057.1
April 11, 2007