CD4504BMS Datasheet, PDF (6/8 Pages) Intersil Corporation – CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation

Specifications CD4504BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1 2, 4, 6, 10, 12, 15 3, 5, 7-9, 11, 14
16
(Note 1)
1, 13
Static Burn-In 2 2, 4, 6, 10, 12, 15
8
(Note 1)
16
1, 3, 5, 7, 9, 11,
13, 14
Dynamic Burn-
-
In (Note 1, 3)
8
16
1, 2, 4, 6, 10, 12, 3, 5, 7, 9, 11, 14
15
Irradiation
(Note 2)
2, 4, 6, 10, 12, 15
8
1, 3, 5, 7, 9, 11, 13,
14, 16
NOTES:
1. Each pin except VCC, VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VCC, VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
3. Oscillator output to be VDD/2.
7-1145