CD4504BMS Datasheet, PDF (5/8 Pages) Intersil Corporation – CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation

Specifications CD4504BMS
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
LIMITS
PARAMETER
Propagation Delay
CMOS - CMOS,
VDD > VCC
Propagation Delay
CMOS - CMOS
VCC > VDD
Transition Time
Input Capacitance
SYMBOL
CONDITIONS
TPLH2 VDD = 15V, VCC = 5V
VDD = 15V, VCC = 10V
TPLH3 VDD = 5V, VCC = 15V
VDD = 10V, VCC = 15V
TTHL
TTLH
CIN
VDD = 10V
VDD = 15V
Any Input
NOTES
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2
TEMPERATURE MIN
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
+25^oC
-
MAX
240
140
UNITS
ns
ns
400
ns
120
ns
100
ns
80
ns
7.5
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
P Threshold Voltage
P Threshold Voltage
Delta
Functional
Propagation Delay Time
SYMBOL
CONDITIONS
IDD VDD = 20V, VIN = VDD or GND
VNTH VDD = 10V, ISS = -10µA
∆VTN VDD = 10V, ISS = -10µA
VTP
∆VTP
VSS = 0V, IDD = 10µA
VSS = 0V, IDD = 10µA
F
TPHL
TPLH
VDD = 18V, VIN = VDD or GND
VDD = 3V, VIN = VDD or GND
VDD = 5V
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
NOTES
1, 4
1, 4
1, 4
TEMPERATURE MIN
+25^oC
-
+25^oC
-2.8
+25^oC
-
1, 4
+25^oC
0.2
1, 4
+25^oC
-
1
1, 2, 3, 4
+25^oC
+25^oC
VOH >
VDD/2
-
3. See Table 2 for +25^oC limit.
4. Read and Record
MAX
7.5
-0.2
±1
2.8
±1
VOL <
VDD/2
1.35 x
+25^oC
Limit
UNITS
µA
V
V
V
V
V
ns
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25^oC
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-1
IDD
± 0.2µA
Output Current (Sink)
IOL5
± 20% x Pre-Test Reading
Output Current (Source)
IOH5A
± 20% x Pre-Test Reading
CONFORMANCE GROUP
Initial Test (Pre Burn-In)
Interim Test 1 (Post Burn-In)
Interim Test 2 (Post Burn-In)
PDA (Note 1)
TABLE 6. APPLICABLE SUBGROUPS
MIL-STD-883
METHOD
GROUP A SUBGROUPS
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9
100% 5004
1, 7, 9, Deltas
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
7-1144