CD40174BMS Datasheet, PDF (6/8 Pages) Intersil Corporation – CMOS Hex ‘D’-Type Flip-Flop

Specifications CD40174BMS
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1 2, 5, 7, 10, 12, 15 1, 3, 4, 6, 8, 9, 11,
16
(Note 1)
13, 14
Static Burn-In 2 2, 5, 7, 10, 12, 15
8
(Note 1)
1, 3, 4, 6, 9, 11,
13, 14, 16
Dynamic Burn-In
-
(Note 1)
8
1, 16
2, 5, 7, 10, 12, 15
9
3, 4, 6, 11, 13, 14
Irradiation
2, 5, 7, 10, 12, 15
8
(Note 2)
1, 3, 4, 6, 9, 11,
13, 14, 16
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
Logic Diagram
CL
p
D
n
3 (4, 6, 11, 13, 14)
CL
CLR*
1
CL
CLK*
9
CL
p
n
CL
CL
CL
p
n
CL
CL
p
n
CL
Q
2 (5, 7, 10, 12, 15)
* All inputs (terms 1, 3, 4, 6, 9, 11, 13, 14)
protected by COS/MOS protection network
VDD
VSS
CLOCK
X
1 = High Level
2 = Low Level
FIGURE 1. 1 OF 6 FLIP-FLOPS
TRUTH TABLE FOR 1 OF 6 FLIP-FLOPS
INPUTS
DATA
0
1
X
X
CLEAR
1
1
1
0
X = Don’t Care
NC = No Change
OUTPUT
Q
0
1
NC
0
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