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X95840 Datasheet, PDF (5/13 Pages) Intersil Corporation – Quad Digital Controlled Potentiometers
X95840
Operating Specifications Over the recommended operating conditions unless otherwise specified. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
TYP
MIN (Note 1)
tSU:DAT Input data setup time
tHD:DAT Input data hold time
tSU:STO STOP condition setup time
tHD:STO STOP condition setup time
tDH (Note 15) Output data hold time
tR (Note 15) SDA and SCL rise time
From SDA exiting the 30% to 70% of VCC window, to
SCL rising edge crossing 30% of VCC
From SCL rising edge crossing 70% of VCC to SDA
entering the 30% to 70% of VCC window.
From SCL rising edge crossing 70% of VCC, to SDA
rising edge crossing 30% of VCC.
From SDA rising edge to SCL falling edge. Both
crossing 70% of VCC.
From SCL falling edge crossing 30% of VCC, until SDA
enters the 30% to 70% of VCC window.
From 30% to 70% of VCC
100
0
600
600
0
20 +
0.1 * Cb
tF (Note 15) SDA and SCL fall time
From 70% to 30% of VCC
20 +
0.1 * Cb
Cb (Note 15) Capacitive loading of SDA or Total on-chip and off-chip
10
SCL
Rpu (Note 15) SDA and SCL bus pull-up Maximum is determined by tR and tF.
1
resistor off-chip
For Cb = 400pF, max is about 2~2.5kΩ.
For Cb = 40pF, max is about 15~20kΩ
tWP
Non-volatile Write cycle time
12
(Notes 15, 16)
tSU:WPA A2, A1, A0, and WP setup Before START condition
600
time
tHD:WPA A2, A1, A0, and WP hold
After STOP condition
600
time
MAX
250
250
400
20
SDA vs SCL Timing
tF
tHIGH
tLOW
tR
UNITS
ns
ns
ns
ns
ns
ns
ns
pF
kΩ
ms
ns
ns
SCL
tSU:STA
SDA
(Input Timing)
SDA
(Output Timing)
tSU:DAT
tHD:STA
tHD:DAT
tAA tDH
tSU:STO
tBUF
5
FN8213.1
September 27, 2005