82C83H Datasheet, PDF (3/6 Pages) Intersil Corporation – CMOS Octal Latching Inverting Bus Driver

82C83H
Absolute Maximum Ratings
Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND 0.5V to V_CC +0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C83H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0^oC to +70^oC
I82C83H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40^oC to +85^oC
M82C83H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55^oC to +125^oC
Thermal Resistance (Typical)
θ_JAoC/W θ_JCoC/W
CERDIP Package . . . . . . . . . . . . . . . .
70
16
CLCC Package . . . . . . . . . . . . . . . . . .
80
20
PDIP Package . . . . . . . . . . . . . . . . . . .
75
N/A
PLCC Package . . . . . . . . . . . . . . . . . .
75
N/A
Storage Temperature Range . . . . . . . . . . . . . . . . . .-65^oC to +150^oC
Max Junction Temperature Ceramic Package . . . . . . . . . . . . . . +175^oC
Max Junction Temperature Plastic Package. . . . . . . . . . . . . . . . +150^oC
Lead Temperature (Soldering 10s) (PLCC - Lead Tips Only) . . +300^oC
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 265 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications V_CC = 5.0V ± 10%; T_A = 0^oC to +70^oC (C82C83H);
T_A = -40^oC to +85^oC (I82C83H);
T_A = -55^oC to +125^oC (M82C83H)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
V_IH
Logical One Input Voltage
2.0
-
2.2
V
C82C83H, I82C83H,
M82C83H, (Note 1)
V_IL
V_OH
V_OL
I_I
Logical Zero Input Voltage
Logical One Output Voltage
Logical Zero Output Voltage
Input Leakage Current
0.8
3.0
-
V_CC -0.4V
0.45
-10
10
V
V
I_OH = -8mA,
I_OH = -100mA, OE = GND
V
I_OL = 20mA, OE = GND
µA
V_IN = GND or V_CC,
DIP Pins 1-9,11
I_O
Output Leakage Current
-10
10
µA
V_O = GND or OE ≥ V_CC -0.5V
DIP Pins 12-19
lCCSB
Standby Power Supply Current
-
IC COP Operating Power Supply Current
-
10
µA
V_IN = V_CC or GND
V_CC = 5.5V Outputs Open
1
mA/
T_A = +25^oC, V_CC = 5V, Typical
MHz
(See Note 2)
NOTES:
1. V_IH is measured by applying a pulse of magnitude = V_lHMIN to one data Input at a time and checking the corresponding device output for
a valid logical 1 - during valid input high time. Control pins (STB, CE) are tested separately with all device data input pins at V_CC -0.4V.
2. Typical ICCOP = 1 mA/MHz of STB cycle time. (Example: 5MHz µP, ALE = 1.25MHz, ICCOP = 1.25mA).
Capacitance T_A = +25^oC
SYMBOL
PARAMETER
C_IN
C_OUT
Input Capacitance
Output Capacitance
TYPICAL
13
20
UNITS
pF
pF
TEST CONDITIONS
FREQ = 1MHz, all measure-
ments are referenced to device
GND
4-283