ISL73841SEH Datasheet, PDF (17/23 Pages) Intersil Corporation – Radiation Tolerant 30V 32-Channel Analog Multiplexer

ISL73841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
20
300
15
BIASED
10
5
250 ^BIASED
200
GROUNDED
150
0
100
GROUNDED
-5
50
-100
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 41. t_ENABLE SHIFT vs LDR RADIATION
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 42. t_DISABLE SHIFT vs LDR RADIATION
Post Low Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± = ±12V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
1.2
0
1.0
GROUNDED
0.8
0.6
BIASED
0.4
0.2
-0.2
-0.4
BIASED
-0.6
-0.8
-1.0
GROUNDED
-1.2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 43. I_CC SUPPLY CURRENT SHIFT vs LDR RADIATION
-1.4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 44. I_EE SUPPLY CURRENT SHIFT vs LDR RADIATION
2.5
2.0
GROUNDED
1.5
1.0
BIASED
0.5
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 45. I_REF SUPPLY CURRENT SHIFT vs LDR RADIATION
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35
30
25
20
BIASED
15
10
5
0
GROUNDED
-50
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 46. r_DS(ON) SHIFT (V_IN = V⁺) vs LDR RADIATION
FN8846.1
May 31, 2016