ISL73841SEH Datasheet, PDF (16/23 Pages) Intersil Corporation – Radiation Tolerant 30V 32-Channel Analog Multiplexer

ISL73841SEH
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
6
25
5
4
BIASED
3
2
1
GROUNDED
20
15
BIASED
10
0
-1
5
-2
-3
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
0
GROUNDED
-5
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 35. r_DS(ON) Shift (V_IN = -5V) vs LDR RADIATION
FIGURE 36. r_DS(ON) SHIFT (V_IN = V⁺) vs LDR RADIATION
0
-1
-2
-3
GROUNDED
-4
-5
-6
-7
-8
-9
BIASED
-10
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 37. r_DS(ON) SHIFT (V_IN = V^-) vs LDR RADIATION
250
BIASED
200
150
GROUNDED
100
50
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 38. t_ADD SHIFT (LOW TO HIGH) vs LDR RADIATION
0
-10
-20
-30
-40
-50
-60
-70
-80
-90
-1000
BIASED
GROUNDED
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 39. t_ADD SHIFT (HIGH TO LOW) vs LDR RADIATION
14
GROUNDED
12
10
8
6
BIASED
4
2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 40. t_BBM SHIFT vs LDR RADIATION
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FN8846.1
May 31, 2016