ISL70244SEH Datasheet, PDF (17/21 Pages) Intersil Corporation – Rail-to-rail input and output

ISL70244SEH
Post Low Dose Rate Radiation Characteristics Unless otherwise specified, V_S ± 19.8V,
V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This data is
intended to show typical parameter shifts due to high dose rate radiation. These are not limits nor are they guaranteed.
30
20
GROUNDED
V_S = ±19.8V
30
20
GROUNDED
V_S = ±19.8V
10
10
0
-10
BIASED
0
BIASED
-10
-20
-20
-30 ₀
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 57. V_OS SHIFT vs LOW DOSE RATE RADIATION
-30 ₀
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 58. I_BIAS+ vs LOW DOSE RATE RADIATION
40
V_S = ±19.8V
30
20
BIASED
10
0
-10
-20
-30
GROUNDED
-400
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 59. I_BIAS- vs LOW DOSE RATE RADIATION
0.80
V_S = ±19.8V
0.60
0.40
0.20
GROUNDED
0.00
-0.20
-0.40
-0.60
BIASED
-0.80
0
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 61. I⁺ vs LOW DOSE RATE RADIATION
2.0
1.5
V_S = ±19.8V
1.0
BIASED
0.5
0
-0.5
-1.0
-1.5
GROUNDED
-2.0
0
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 60. I_OS vs LOW DOSE RATE RADIATION
0.80
0.60
BIASED
0.40
V_S = ±19.8V
0.20
0.00
-0.20
GROUNDED
-0.40
-0.60
-0.800
10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 62. I^- vs LOW DOSE RATE RADIATION
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FN8592.2
September 1, 2016