DG526 Datasheet, PDF (11/16 Pages) Intersil Corporation – Analog CMOS Latchable Multiplexers

DG526, DG527, DG528, DG529
Test Circuits and Waveforms (Continued)
3V
EN
0
+15V
V+
A₀, A₁, (A₂₎
RS
DG528
DG529†
Sx
D
+2.4V
V_O
V_O
∆V_O
∆V_O is the measured voltage error due to charge injection.
The error voltage in Coulombs is Q = C_L x ∆V_O.
FIGURE 8A. CHARGE INJECTION WAVEFORMS
Typical Performance Curves
GND WR V-
C_L = 1000pF
EN
-15V
FIGURE 8B. CHARGE INJECTION TEST CIRCUIT
† Similar connections for DG526, DG527
550
500 ^IO ^{= -200µA}
V_EN = +5V
450
400
(D)
(C)
350
(B)
300
(A)
250
200
150
(A) V+ = +15V, V- = -15V
100
(B) V+ = +12V, V- = -12V
(C) V+ = +10V, V- = -10V
50
(D) V+ = +7.5V, V- = -7.5V
0
-15 -13 -11 -9 -7 -5 -3 -1 0 +1 +3 +5 +7 +9 +11 +13 +15
ANALOG SIGNAL VOLTAGE (V)
FIGURE 9. r_DS(ON) vs ANALOG SIGNAL VOLTAGE vs SUPPLY
VOLTAGE
400
360
V+ = +15V V- = -15V
V_EN = 2.4V
320 ^{IO = -200µA}
+10V SIGNALS
280
+10V SIGNALS
240
200
160
120
80
40
0
-55
-25
0
25
45
70
TEMPERATURE (^oC)
100 125
FIGURE 10. TYPICAL r_DS(ON) VARIATION WITH TEMPERATURE
12-11