82573 Datasheet, PDF (15/39 Pages) Intel Corporation – GbE Controllers

Datasheet—82573
2.7
2.7.1
2.7.2
2.7.3
Test Signals
MAC Test Signals
Signal
TEST_EN
ALT_CLK125
JTAG_TCK
JTAG_TDI
JTAG_TDO
JTAG_TMS
CLK_VIEW
TEST[16:0] for
the 82573E/V
TEST[10:0] for
the 82573L
Type
Name and Function
I
NC
I
I
O/OD
I
NC
Rsvd
Factory Test Pin
A 1 KΩ pull-down resistor should be attached to ground from this pin for normal
operation.
Alternate 125 MHz Clock
This signal should not be connected. This signal has an internal pull-up resistor.
JTAG Test Access Port Clock
This signal has an internal pull-down resistor.
JTAG Test Access Port Test Data In
This signal has an internal pull-up resistor.
JTAG Test Access Port Test Data Out
JTAG Test Access Port Mode Select
This signal has an internal pull-up resistor.
Clock View
The Clock View signal is an output for the clock signals required for IEEE testing.
This signal has an internal pull-up resistor.
Test Pin[16:0]
These test pins are for the 82573E/V only. These signals have internal pull-up
resistor. For normal operation, these pins should be left unconnected.
Test Pin[10:0]
These test pins are for the 82573L only. These signals have internal pull-up
resistor. For normal operation, these pins should be left unconnected.
PHY Test Signals
Signal
Type
Name and Function
PHY_HSDACn
PHY_HSDACp
(82573E/V)
PHY_TESTn
PHY_TESTp
(82573L only)¹
A(Out)
PHY_TSTPT
PHY Differential Test Port
These signals are used for factory test purposes only.
PHY Test Port
This signal is used for factory test purposes only. This pin must be left
unconnected for normal operation.
1. These signals are used in all three devices and have the same functionality but are denoted as PHY_HSDACn
and PHY_HSDACp in the 82573E/V and PHY_TESTn and PHY_TESTp in the 82573L.
Other Test Signals
Signal
SDP[3:0]
Type
Name and Function
NC
These signals are used for factory test purposes only and have internal pull-up
resistors.
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