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TLE4925 Datasheet, PDF (6/25 Pages) Infineon Technologies AG – Differential Hall Sensor
PRELIMINARY
1.2 Electro Magnetic Compatibility - (values depend on RSeries!)
Ref. ISO 7637-1; see test circuit of figure 4 and 5;
∆BPP = 10mT (ideal sinusoidal signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200Ω;
No.
Parameter
Symbol
Level/typ
Status
1.2.1
Testpulse 1
VEMC
IV / -100V
C2
Testpulse 2
IV / 100V
C2
Testpulse 3a
IV / -150V
A
Testpulse 3b
IV / 100V
A
Testpulse 4
IV / -7V
A
Testpulse 5
IV / 86.5V
C
Note: Test criteria for status A: No missing pulse no additional pulse on the IC output signal plus duty
cycle and jitter are in the specification limits.
Test criteria for status B: No missing pulse no additional pulse on the IC output signal.
(Output signal “OFF” means switching to the voltage of the pull-up resistor).
Test criteria for status C: One or more parameter can be out of specification during the exposure
but returns automatically to normal operation after exposure is removed.
Test criteria for status E: IC destroyed.
Ref. ISO 7637-3; TP 1 and TP 2 ref. DIN 40839-3; see test circuit of figure 4 and 5;
∆BPP = 10mT (ideal sinusoidal signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200Ω;
No.
Parameter
Symbol
Level/typ
Status
1.2.2
Testpulse 1
VEMC
IV / -30V
A
Testpulse 2
IV / 30V
A
Testpulse 3a
IV / -60V
A
Testpulse 3b
IV / 40V
A
Ref. ISO 11452-3; see test circuit of figure 4 and 5; measured in TEM-cell;
∆BPP = 4mT (ideal sinusoidal signal); VS=13.5V ± 0,5V, fB= 200Hz; T= 25°C; RSeries ≥ 200Ω;
No.
Parameter
Symbol
Level/max
Remarks
1.2.3 EMC field strength
ETEM -Cell
IV / 200V/m
AM=80%, f=1kHz;
Note: Stresses above those listed here may cause permanent damage to the device. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
Test condition for the trigger window: fB-field=200Hz, Bpp=4mT, vertical limits are ±200mV and
horizontal limits are ±200µs.
2 According to 7637-1 the supply switched „OFF“ for t=200ms. For battery „ON“ is valid status „A“.
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