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TLE4997 Datasheet, PDF (12/36 Pages) Infineon Technologies AG – Programmable Linear Hall Sensor for Industrial Use
3
Maximum Ratings
TLE4997I
Maximum Ratings
Table 2
Absolute Maximum Ratings
Parameter
Symbol Limit Values Unit Notes
Storage temperature
Junction temperature
Voltage on VDD pins with
respect to ground (VSS)
Supply current
@ overvoltage
TST
TJ
VDD
IDDov
min.
max.
-40
150
°C
-40
150
°C
-16 2)
16 3)
V
1)
1)
RTHja ≤ 150 K/W
-
52
mA
Supply current
@ reverse voltage
IDDrev
Voltage on output pin with
respect to ground (VSS)
Magnetic field
ESD protection
VOUTov
BMAX
VESD
- 75
-16 4)
-
-
-
mA
16 3)
V
unlimited T
2.0
kV
RTHja ≤ 150 K/W
Vout may be > VDD
According HBM
JESD22-A114-B 5)
1) For limited time only. Depends on customer temperature lifetime cycles. Please ask for support by Infineon.
2) max 24 h @ -40°C ≤ TJ < 30°C
max 10 min. @ 30°C ≤ TJ < 80°C
max 30 sec. @ 80°C ≤ TJ < 120°C
3) max. 24 h @ TJ < 80°C.
4) Max. 1 ms @ TJ < 30°C; -8.5 V for 100 h @ TJ < 80°C.
5) 100 pF and 1.5 kΩ
Note: Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Furthermore, only
single error cases are assumed. More than one stress/error case may also
damage the device.
Exposure to absolute maximum rating conditions for extended periods may affect
device reliability. During absolute maximum rating overload conditions (VIN > VDD
or VIN < VSS) the voltage on VDD pins with respect to ground (VSS) must not
exceed the values defined by the absolute maximum ratings.
Data Sheet
12
V 1.0, 2007-06