ICS85105I Datasheet, PDF (7/16 Pages) Integrated Device Technology – LOW SKEW, 1-TO-5, DIFFERENTIAL/LVCMOS-TO-0.7V HCSL FANOUT BUFFER

ICS85105I
LOW SKEW, 1-TO-5, DIFFERENTIAL/LVCMOS-TO-0.7V HCSL FANOUT BUFFER
3.3V±10%
PARAMETER MEASUREMENT INFORMATION
3.3V±10%
SCOPE
VDD
50Ω
HCSL
50Ω
GND
475Ω
IREF
0V
This load condition is used for I , tsk(o), t , and tjit measurements.
DD
PD
HCSL OUTPUT LOAD AC TEST CIRCUIT
V_DD
nCLK0
V
PP
CLK0
Cross Points
V
CMR
GND
DIFFERENTIAL INPUT LEVELS
nQx
Qx
nQy
Qy
t sk(o)
OUTPUT SKEW (DIFFERENTIAL INPUT)
CLK1
nQ0:nQ4
Q0:Q4
t_PD
PROPAGATION DELAY (LVCMOS INPUT)
VDD
33Ω
HCSL
33Ω
GND
475Ω
IREF
0V
50Ω
49.9Ω
50Ω
49.9Ω
Qx
2pF
nQx
2pF
HCSL OUTPUT LOAD AC TEST CIRCUIT
PART 1
nQx
Qx
PART 2
nQy
Qy
t sk(pp)
PART-TO-PART SKEW
nCLK0
CLK0
nQ0:nQ4
Q0:Q4
t_PD
PROPAGATION DELAY (DIFFERENTIAL INPUTS)
Rise Edge Rate
Fall Edge Rate
+150mV
0.0V
-150mV
Q - nQ
DIFFERENTIAL MEASUREMENT POINTS FOR RISE/FALL TIME
IDT^™ / ICS^™ 0.7V HCSL FANOUT BUFFER
7
ICS85105AGI REV. A JUNE 5, 2008